Wafer scale integration. Proceedings /ed. by R. Mike Lea, Stuart Tewksbury (Record no. 13266)
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fixed length control field | 00604nam a2200193Ia 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0780318501 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.395 |
Item number | N947 "SER" |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Lea, R Mike. |
245 ## - TITLE STATEMENT | |
Title | Wafer scale integration. Proceedings /ed. by R. Mike Lea, Stuart Tewksbury |
Remainder of title | |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | New Jersey |
Name of publisher, distributor, etc. | IEEE |
Date of publication, distribution, etc. | 1994 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | ix, 404p |
Dimensions | incl. bibl. |
653 ## - INDEX TERM--UNCONTROLLED | |
Uncontrolled term | Very large scale integration; Integrated circuits; IEEE: Computer Society |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | IEEE International Conference on Wafer Scale Integration (6: 1994: San Francisco) |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Tewksbury, Stuart. |
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