Shallow impurities in semiconductors 1988 (Record no. 13212)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0854981896 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 537.622 |
| Item number | N891 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | International Conference on Shallow Impurities in Semiconductors ( Linkoping, Sweden |
| Numeration | 1988 ) |
| 245 ## - TITLE STATEMENT | |
| Title | Shallow impurities in semiconductors 1988 |
| Remainder of title | |
| Statement of responsibility, etc. | ed. by B. Honemar. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Bristol |
| Name of publisher, distributor, etc. | Institute of Physics |
| Date of publication, distribution, etc. | 1989 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 400p. |
| 490 ## - SERIES STATEMENT | |
| Series statement | Institute of physics conference series |
| -- | no.95 |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Semiconductors - impurity distribution |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Honemar, B., ed. |
| 919 ## - | |
| -- | 013445 |
| 964 ## - | |
| -- | |
| -- | 0 |
| -- | |
| -- | |
| -- | 3RD. |
| -- | ED. |
| -- | |
No items available.
