International test conference. ITC 1997. Proceedings (Record no. 124736)
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000 -LEADER | |
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fixed length control field | 00604nam a2200193Ia 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0780342100 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.38154806 |
Item number | N971 "SER" |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | International test conference (28 |
Numeration | 1997 |
-- | Washington, D.C.) |
245 ## - TITLE STATEMENT | |
Title | International test conference. ITC 1997. Proceedings |
Remainder of title | |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | Piscataway |
Name of publisher, distributor, etc. | IEEE |
Date of publication, distribution, etc. | 1997 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1052p. |
Dimensions | incl. bibl. |
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
Topical term or geographic name as entry element | ITC 1997; Semiconductor-testing devices; IEEE |
919 ## - | |
-- | 129576 |
No items available.