Normal view MARC view ISBD view

Physical principles of electron microscopy : An introduction to TEM, SEM, and AEM

Egerton, R. F.

Physical principles of electron microscopy : An introduction to TEM, SEM, and AEM by R F Egerton - 2nd ed - Switzerland Springer 2016 - xi, 196p.

ISBN: 9783319398761

Dewey Class. No.: 502.825 / P161

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)