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Microelectronic test structures. ICMTS 2002. Proceedings

IEEE International conference on microelectronic test structures (2002 Cork)

Microelectronic test structures. ICMTS 2002. Proceedings - Piscataway IEEE 2002 - x, 254p. incl. bibl.

ISBN: 0780374649

Dewey Class. No.: 621.381548 / P021 "SER"

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