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Scanning electron microscopy and X-Ray microanalysis

Goldstein, Joseph I.

Scanning electron microscopy and X-Ray microanalysis by Joseph I. Goldstein, etal. - 3rd ed. - New York Kluwer Academic/Plenum Publishers 2003 - xix, 689p.

Includes CD-ROM

ISBN: 0306472929

Dewey Class. No.: 502.825 / P03

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