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Scanning Electron Microscopy and X-ray Microanalysis by by Joseph I Goldstein., et al

By: Contributor(s): Material type: TextTextPublication details: New York Springer 2003Edition: 3rd edDescription: xix, 690pISBN:
  • 9780306472923
Subject(s): DDC classification:
  • 502.825 P03;4 (CeNSE)
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Item type Current library Call number Status Date due Barcode
Book Book Centre for Nano Science and Engineering 502.825 P03;4 (CeNSE) (Browse shelf(Opens below)) Available 191899

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